Accurate Self Characterization and Correction of A/D Converter Performance

نویسندگان

  • Kumar L Parthasarathy
  • Randall Geiger
چکیده

* This work was supported, in part, by Texas Instruments Inc., Rocketchips Inc, and the R. J. Carver trust. Abstract A new algorithm based on a code density test to measure Integral Non-linearity (INL) of Analog-to-Digital (A/D) converters is introduced. This algorithm uses as an input two related but unknown ‘ramp-like’ signals that can be practically generated on-chip and the corresponding codedensity histogram. The algorithm inherently characterizes both the A/D converter and the inconsequential input. This algorithm finds applications in Self-calibrating A/D converters as well as providing capability for Built-In SelfTest, where generation of an on-chip ramp input test signal of 8bits accuracy or more is a challenge.

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تاریخ انتشار 2001